Citation
Abstract
This article describes the automated fault isolation test programs that have been developed to support rapid turn-around factory (or depot) level maintenance of the Maximum Likelihood Convolutional Decoder (MCD). Functional requirements and detailed design characteristics are described, along with a summary of the evaluation and testing completed so far.
Details
- Volume
- 42-44
- Published
- April 15, 1978
- Pages
- 236–244
- File Size
- 670.1 KB