Citation
Abstract
This article describes a system for the functional testing and simulation of custom and semicustom very large scale integrated (VLSI) chips that are designed using the integrated UNIX-based computer-aided design (CAD) system. The testing and simulation system consists of two parts. One of these is a special purpose hardware device that is capable of controlling the digital inputs and outputs on a custom chip. This device, the Digital Microcircuit Functionality Tester (DMFT) system, can be operated by itself or in conjunction with the VAX host computer on the CAD system. The DMFT is intetegrated into a microprobe station so that these signals can be injected or read from nodes inside the chip, as well as at the pins. The second part of the system is a software package that is installed on the VAX. This software package, “logic,” includes a full-screen editor for developing chip test sequences and drivers for both the DMFT and the “esim” logic simulator.
Details
- Volume
- 42-86
- Published
- August 15, 1986
- Pages
- 171–180
- File Size
- 815.9 KB