Citation
Abstract
A general technique that can be used in testing very-large-scale-integrated (VLSI) chips for the Big Viterbi Decoder (BVD) system is described in this article. The test technique is divided into functional testing and fault-coverage testing. The purpose of functional testing is to verify that the design works functionally. Functional test vectors are converted from outputs of software simulations which simulate the BVD functionally. Fault-coverage testing is used to detect and, in some cases, to locate faulty components caused by bad fabrication. This type of testing is useful in screening out bad chips. Finally, “design for testability,’’ which is included in the BVD VLSI chip design, is described in considerable detail in this article. Both the observability and controllability of a VLSI chip are greatly enhanced by including the design for testability feature.
Details
- Volume
- 42-96
- Published
- February 15, 1989
- Pages
- 80–92
- File Size
- 533.2 KB