Citation
Abstract
The implementation of microelectronic circuits in the DSN is discussed together with utilization of an equivalent MIL-STD-883 Class B device, screening tests to be used and screening philosophy relative to failure mechanism patterns. The costs to be expected and the advantages of standardization of device types to increase quantity buys are also discussed.
Details
- Volume
- XI
- Published
- October 15, 1972
- Pages
- 121–123
- File Size
- 296.1 KB